Life testing technology for lighting electrical ready boards
The lifespan testing technology for lighting electrical ready boards is a key link in ensuring their quality and safety. The following will introduce the testing equipment and methods from two aspects.
Test equipment
The testing equipment needs to have adjustable and stable AC and DC power supplies. The AC power supply is independently adjusted by multiple voltage regulators equipped with digital voltmeters, and each voltage can be set independently. The output is divided into multiple sets of test bits, such as upper, middle, and lower levels, to meet different testing needs. The DC power supply is supplied to specific test positions by a DC adjustable voltage regulator. Each testing position has independent power on indication, working status monitoring, and working time indication functions, which facilitate real-time monitoring of the testing situation. At the same time, through PLC control software, users can individually set and control the voltage, testing time (startup time, shutdown time), and counting control of each test power supply group. They can also set multiple on-off cycles and time settings for each cycle.
test method
Full life testing or fixed number and timed truncation testing can be conducted by referring to relevant standards. The full life test requires that all samples fail during the test, and the MTBF (mean time between failures) is calculated using a simple arithmetic mean; The fixed number and timed truncation tests are terminated based on the specified number of faults or failures and the specified time, respectively.
For high-power lighting related products, there are also accelerated life testing methods. For example, using different driving currents or adjusting temperatures as acceleration stress, the lifespan value under normal usage conditions can be calculated through mathematical models. If selecting 5 LED lamps of the same specifications, adjusting the oven temperature, conducting accelerated life tests under different temperature conditions, recording parameters such as light output and test time, and using the Arrhenius mathematical model to calculate the expected life at 70% of the LED lamp failure criterion at 25 ℃.